@phdthesis{Scheffler2023,
  author    = {Scheffler, Lukas},
  title     = {Molecular beam epitaxy of the half-Heusler antiferromagnet CuMnSb},
  doi       = {10.25972/OPUS-32283},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-322839},
  school      = {Universit{\"a}t W{\"u}rzburg},
  year      = {2023},
  abstract  = {This work presents a newly developed method for the epitaxial growth of the half-Heusler antiferromagnet CuMnSb. All necessary process steps, from buffer growth to the deposition of a protective layer, are presented in detail. Using structural, electrical, and magnetic characterization, the material parameters of the epitaxial CuMnSb layers are investigated. The successful growth of CuMnSb by molecular beam epitaxy is demonstrated on InAs (001), GaSb (001), and InP (001) substrates. While CuMnSb can be grown pseudomorphically on InAs and GaSb, the significant lattice mismatch for growth on InP leads to relaxation already at low film thicknesses. Due to the lower conductivity of GaSb compared to InAs, GaSb substrates are particularly suitable for the fabrication of CuMnSb layers for lateral electrical transport experiments. However, by growing a high-resistive ZnTe interlayer below the CuMnSb layer, lateral transport experiments on CuMnSb layers grown on InAs can also be realized. Protective layers of Ru and Al2O3 have proven to be suitable for protecting the CuMnSb layers from the environment. Structural characterization by high resolution X-ray diffraction (full width at half maximum of 7.7 ′′ of the rocking curve) and atomic force microscopy (root mean square surface roughness of 0.14 nm) reveals an outstanding crystal quality of the epitaxial CuMnSb layers. The half-Heusler crystal structure is confirmed by scanning transmission electron microscopy and the stoichiometric material composition by Rutherford backscattering spectrometry. In line with the high crystal quality, a new minimum value of the residual resistance of CuMnSb (𝜌0 = 35 μΩ ⋅ cm) could be measured utilizing basic electrical transport experiments. An elaborate study of epitaxial CuMnSb grown on GaSb reveals a dependence of the vertical lattice parameter on the Mn/Sb flux ratio. This characteristic enables the growth of tensile, unstrained, and compressive strained CuMnSb layers on a single substrate material. Additionally, it is shown that the N{\´e}el temperature has a maximum of 62 K at stoichiometric material composition and thus can be utilized as a selection tool for stoichiometric CuMnSb samples. Mn-related defects are believed to be the driving force for these observations. The magnetic characterization of the epitaxial CuMnSb films is performed by superconducting quantum interference device magnetometry. Magnetic behavior comparable to the bulk material is found, however, an additional complex magnetic phase appears in thin CuMnSb films and/or at low magnetic fields, which has not been previously reported for CuMnSb. This magnetic phase is believed to be localized at the CuMnSb surface and exhibits both superparamagnetic and spin-glass-like behavior. The exchange bias effect of CuMnSb is investigated in combination with different in- and out-of-plane ferromagnets. It is shown that the exchange bias effect can only be observed in combination with in-plane ferromagnets. Finally, the first attempts at the growth of fully epitaxial CuMnSb/NiMnSb heterostructures are presented. Both magnetic and structural studies by secondary-ion mass spectrometry indicate the interdiffusion of Cu and Ni atoms between the two half-Heusler layers, however, an exchange bias effect can be observed for the CuMnSb/NiMnSb heterostructures. Whether this exchange bias effect originates from exchange interaction between the CuMnSb and NiMnSb layers, or from ferromagnetic inclusions in the antiferromagnetic layer can not be conclusively identified.},
  subject      = {Molekularstrahlepitaxie},
  language  = {en}
}