@article{ReuschGrimmerHeuer1994,
  author    = {Reusch, Wolfgang and Grimmer, Th. and Heuer, D.},
  title     = {Magnetfeld l{\"a}ngs der Achse von Kreisstr{\"o}men - Messung und Modellierungen mit Animation},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-30611},
  year      = {1994},
  abstract  = {No abstract available},
  language  = {de}
}
@article{RoeschAtzmuellerSchaacketal.1994,
  author    = {R{\"o}sch, M. and Atzm{\"u}ller, R. and Schaack, G. and Becker, Charles R.},
  title     = {Resonant Raman scattering in a zero-gap semiconductor: Interference effects and deformation potentials at the E\(_1\) and E\(_1\) + \(\Delta_1\) gaps of HgTe},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-38062},
  year      = {1994},
  abstract  = {No abstract available},
  language  = {en}
}
@article{ZhangBeckerZhangetal.1994,
  author    = {Zhang, X. F. and Becker, Charles R. and Zhang, H. and He, L. and Landwehr, G.},
  title     = {Investigation of a short period (001) HgTe-Hg\(_{0.6}\)Cd\(_{0.4}\)Te superlattice by transmission electron microscopy},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-38029},
  year      = {1994},
  abstract  = {No abstract available},
  language  = {en}
}
@article{EinfeldtHeinkeBehringeretal.1994,
  author    = {Einfeldt, S. and Heinke, H. and Behringer, M. and Becker, Charles R. and Kurtz, E. and Hommel, D. and Landwehr, G.},
  title     = {The growth of HgSe by molecular beam epitaxy for ohmic contacts to p-ZnSe},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-38001},
  year      = {1994},
  abstract  = {The structural properties of HgSe grown by molecular beam epitaxy (MBE) are investigated for different lattice mismatches to the substrate and various growth conditions. The growth rate is shown to depend strongly on the growth temperature above lOO°C as well as on the Hg/Se flux ratio. It has been found that the crystalline perfection and the electrical properties are mainly determined by the layer thickness, especially for the growth on highly lattice mismatched substrates. Changes in the surface morphology are related to growth parameters. Differences between the electrical behavior of MBE-grown and bulk HgSe are discussed. The electrical properties of HgSe contacts on p-ZnSe are investigated as a function of different annealing procedures.},
  language  = {en}
}
@article{SchikoraHausleitnerEinfeldtetal.1994,
  author    = {Schikora, D. and Hausleitner, H. and Einfeldt, S. and Becker, Charles R. and Widmer, T. and Giftige, C. and Lischka, K. and von Ortenburg, M. and Landwehr, G.},
  title     = {Epitaxial overgrowth of II-VI compounds on patterned substrates},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-37985},
  year      = {1994},
  abstract  = {The selected area epitaxial overgrowth of narrow gap HgTe as well as wide gap CdTe and ZnTe on CdTe/GaAs substrates, which had been structured by dry etching techniques, has been investigated. A plasma etching process using a barrel reactor with CH\(_4\)-CH\(_2\) gases has been employed to prepare stripes with a width of about 1 μm with anisotropic as well as isotropic etching profiles. It has been found, that the selected area HgTe overgrowth takes place with a high local selectivity to the low index planes of the patterned surface. In contrast, the selected area overgrowth of the wide gap CdTe and ZnTe is controlled by anisotropic growth kinetics provided that the substrate temperature is not lower than 220°C and the starting surface consists of well developed low index crystallographic planes.},
  language  = {en}
}
@article{ToenniesBacherForcheletal.1994,
  author    = {T{\"o}nnies, D. and Bacher, G. and Forchel, Alfred and Waag, A. and Litz, Th. and Hommel, D. and Becker, Charles R. and Landwehr, G. and Heuken, M. and Scholl, M.},
  title     = {Optical study of interdiffusion in CdTe and ZnSe based quantum wells},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-37750},
  year      = {1994},
  abstract  = {No abstract available},
  language  = {en}
}
@inproceedings{BoegeSchaeferShanjiaetal.1994,
  author    = {Boege, P. and Sch{\"a}fer, H. and Shanjia, Xu and Xinzhang, Wu and Einfeldt, S. and Becker, Charles R. and Hommel, D. and Geick, R.},
  title     = {Improved conductivity-measurement of semiconductor epitaxial layers by means of the contactless microwave method},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-37763},
  year      = {1994},
  abstract  = {Measurements and calculations of the scattering-characteristics of stratified lossy dielectric blocks completely filling a waveguide cross section are presented. The method is used for contactless conductivity measurements of MBE-grown II-VI semiconductor layers.},
  subject      = {Millimeterwelle},
  language  = {en}
}
@article{XuShengGreineretal.1994,
  author    = {Xu, Shanjia and Sheng, Xinqing and Greiner, P. and Becker, Charles R. and Geick, R.},
  title     = {High-order finite-element analysis of scattering properties of II-VI semiconductor materials},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-86283},
  year      = {1994},
  abstract  = {The sattering characteristics ot the n-VI semiconductors were analyzed by a method which combines the second-order finite-element method with the rigorous mode matching procedure. The method avolds the difficulty of solving the complex transcendental equation introduced in the multimode network method and calculates all the eigenvalues and eigenfunctions simultaneously which are needed for the mode matching treatment in the longitudinal direction. As a result, the whole solution procedure is significantly simplified. A comparison is given between the experimental data and the calculated results obtained with this analysis and tbe network method. Very good agreement has been achieved, the accuracy and efficiency of the present method are thus verified.},
  subject      = {Halbleiter},
  language  = {en}
}