@article{XuShengGreineretal.1994,
  author    = {Xu, Shanjia and Sheng, Xinqing and Greiner, P. and Becker, Charles R. and Geick, R.},
  title     = {High-order finite-element analysis of scattering properties of II-VI semiconductor materials},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-86283},
  year      = {1994},
  abstract  = {The sattering characteristics ot the n-VI semiconductors were analyzed by a method which combines the second-order finite-element method with the rigorous mode matching procedure. The method avolds the difficulty of solving the complex transcendental equation introduced in the multimode network method and calculates all the eigenvalues and eigenfunctions simultaneously which are needed for the mode matching treatment in the longitudinal direction. As a result, the whole solution procedure is significantly simplified. A comparison is given between the experimental data and the calculated results obtained with this analysis and tbe network method. Very good agreement has been achieved, the accuracy and efficiency of the present method are thus verified.},
  subject      = {Halbleiter},
  language  = {en}
}
@article{DeciusBeckerFredericks1972,
  author    = {Decius, J. C. and Becker, Charles R. and Fredericks, W. J.},
  title     = {Force constants of the metaborate ion in alkali halides},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-50935},
  year      = {1972},
  abstract  = {No abstract available},
  subject      = {Physik},
  language  = {en}
}
@article{BeckerHeEinfeldtetal.1993,
  author    = {Becker, Charles R. and He, L. and Einfeldt, S. and Wu, Y. S. and L{\´e}rondel, G. and Heinke, H. and Oehling, S. and Bicknell-Tassius, R. N. and Landwehr, G.},
  title     = {Molecular beam epitaxial growth and characterization of (100) HgSe on GaAs},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-50947},
  year      = {1993},
  abstract  = {In this paper, we present results on the first MBE growth of HgSe. The influence of the GaAs substrate temperature as well as the Hg and Se fluxes on the growth and the electrical properties has been investigated. It has been found that the growth rate is very low at substrate temperatures above 120°C. At 120°C and at lower temperatures, the growth rate is appreciably higher. The sticking coefficient of Se seems to depend inversely on the Hg/Se flux ratio. Epitaxial growth could be maintained at 70°C with Hg/Se flux ratios between lOO and ISO, and at 160°C between 280 and 450. The electron mobilities of these HgSe epilayers at room temperature decrease from a maximum value of 8.2 x 10^3 cm2 /V' s with increasing electron concentration. The concentration was found to be between 6xlO^17 and 1.6x10^19 cm- 3 at room temperature. Rocking curves from X-ray diffraction measurements of the better epilayers have a full width at half maximum of 5S0 arc sec.},
  subject      = {Physik},
  language  = {en}
}
@article{GreinerPolignoneBeckeretal.1992,
  author    = {Greiner, P. and Polignone, L. and Becker, Charles R. and Geick, R.},
  title     = {Contactless measurement of the conductivity of II-VI epitaxial layers by means of the partially filled waveguide method},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-37838},
  year      = {1992},
  abstract  = {We report the contactless determination of the conductivity, the mobility and the carrier concentration of II-VI semiconductors by means of the technique of the partially filled waveguide at a microwave frequency of 9 GHz. The samples are CdHgTe epitaxial layers, grown on CdZnTe substrates by molecular beam epitaxy. The conductivity is determined from the transmission coefficient of the sample in the partially filled waveguide. For the analysis of the experimental data, the complex transmission coefficient is calculated by a rigorous multi-mode matching procedure. By varying the conductivity of the sample, we obtain an optimum fit of the calculated data to the experimental results. Comparison with conductivity data determined by the van der Pauw method shows that our method allows to measure the conductivity with good accuracy. The behaviour of the transmission coefficient of the sample is discussed in dependence on the layer conductivity, the layer thickness and the dielectric constant of the substrate. The calculations require to consider in detail the distribution of the electromagnetic fields in the sample region. The usual assumption of a hardly disturbed TE\(_{10}\) mode cannot be used in our case. By applying a magnetic field in extraordinary Voigt configuration. galvanomagnetic measurements have been carried out which yield the mobility and thus the carrier concentration. These results are also in good agreement with van der Pauw transport measurements.},
  language  = {en}
}
@misc{DeciusBeckerFredericks1973,
  author    = {Decius, J. C. and Becker, Charles R. and Fredericks, W. J.},
  title     = {Erratum: Force constants of the metaborate ion in alkali halides},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-37992},
  year      = {1973},
  abstract  = {Erratum for the article: Decius, J. C. ; Becker, Charles R. ; Fredericks, W. J. : Force constants of the metaborate ion in alkali halides, In: THE JOURNAL OF CHEMICAL PHYSICS (1972), 56, 10, 5189-5190.},
  language  = {en}
}
@article{RoeschAtzmuellerSchaacketal.1994,
  author    = {R{\"o}sch, M. and Atzm{\"u}ller, R. and Schaack, G. and Becker, Charles R.},
  title     = {Resonant Raman scattering in a zero-gap semiconductor: Interference effects and deformation potentials at the E\(_1\) and E\(_1\) + \(\Delta_1\) gaps of HgTe},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-38062},
  year      = {1994},
  abstract  = {No abstract available},
  language  = {en}
}
@article{KrausBeckerScholletal.1993,
  author    = {Kraus, M. M. and Becker, Charles R. and Scholl, S. and Wu, Y. S. and Yuan, S. and Landwehr, G.},
  title     = {Infrared photoluminescence on molecular beam epitaxially grown Hg\(_{1-x}\)Cd\(_x\)Te layers},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-38053},
  year      = {1993},
  abstract  = {No abstract available},
  language  = {en}
}
@article{HeBeckerBicknellTassiusetal.1993,
  author    = {He, L. and Becker, Charles R. and Bicknell-Tassius, R. N. and Scholl, S. and Landwehr, G.},
  title     = {Molecular beam epitaxial growth of (100) Hg\(_{0.8}\)Cd\(_{0.2}\)Te on Cd\(_{0.96}\)Zn\(_{0.04}\)Te},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-38044},
  year      = {1993},
  abstract  = {No abstract available},
  language  = {en}
}
@article{WuBeckerWaagetal.1993,
  author    = {Wu, Y. S. and Becker, Charles R. and Waag, A. and von Schierstedt, K. and Bicknell-Tassius, R. N. and Landwehr, G.},
  title     = {Surface sublimation of zinc blende CdTe},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-37829},
  year      = {1993},
  abstract  = {The surface sublimation of Cd and Te atoms from the zinc blende (111)A CdTe surface has been investigated in detail by reflection high energy electron diffraction and x-ray photoelectron spectroscopy. These experiments verify that Te is much easier to evaporate than Cd. The experimental value for the Te activation energy from a Te stabilized (111)A CdTe surface is 1.41 ±0.1O eV, which is apparently inconsistent with recent theoretical results.},
  language  = {en}
}
@article{WuBeckerWaagetal.1992,
  author    = {Wu, Y. S. and Becker, Charles R. and Waag, A. and Bicknell-Tassius, R. N. and Landwehr, G.},
  title     = {Thermal effects on (100) CdZnTe substrates as studied by x-ray photoelectron spectroscopy and reflection high energy electron diffraction},
  issn      = {0003-6951},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-37801},
  year      = {1992},
  abstract  = {The influence of different CdZnTe substrate treatments prior to II-VI molecular beam epitaxial growth on surface stoichiometry, oxygen, and carbon contamination has been studied using x-ray photoelectron spectroscopy and reflection high energy electron diffraction. Heating the substrate at 300 °C can eliminate oxygen contamination, but cannot completely remove carbon from the surface. Heating at higher temperatures decreases the carbon contamination only slightly, while increasing the Zn-Cd ratio on the surface considerably. The magnitude of the latter effect is surprising and is crucial when one is using lattice matched CdZnTe (Zn 4\%) substrates.},
  language  = {en}
}