@phdthesis{Schafferhans2011,
  author    = {Schafferhans, Julia},
  title     = {Investigation of defect states in organic semiconductors: Towards long term stable materials for organic photovoltaics},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-57669},
  school      = {Universit{\"a}t W{\"u}rzburg},
  year      = {2011},
  abstract  = {In this work, the trap states in the conjugated polymer P3HT, often used as electron donor in organic bulk heterojunction solar cells, three commonly used fullerene based electron acceptors and P3HT:PC61BM blends were investigated. Furthermore, the trap states in the blend were compared with these of the pure materials. Concerning the lifetime of organic solar cells the influence of oxygen on P3HT and P3HT:PC61BM blends was studied. The experimental techniques used to investigate the trap states in the organic semiconductors were (fractional) thermally stimulated current (TSC) and current based deep level transient spectroscopy (Q-DLTS). Fractional TSC measurements on P3HT diodes revealed a quasi-continuous trap distribution. The distribution suggested two different traps in P3HT with approximately Gaussian energy distributions and maxima at about 50 meV and 105 meV. Thereby, the former was attributed to the tail states within the regular Gaussian density of states due to the low activation energy. The latter, deeper traps, however, exhibited a strong dependence on oxygen. Exposure of the P3HT diodes to oxygen, ambient air and synthetic (dry) air all revealed an increase of the deeper traps density with exposure time in the same manner. While the lower limit of the trap density in non aged P3HT samples was in the range of (1.0 - 1.2)×10^22 m^-3, it was more than doubled after an exposure of 50 h to air. An increase of the trap density with oxygen exposure time was also seen in the Q-DLTS measurements accompanied with an increase of the temperature dependence of the emission rates, indicating an enhanced formation of deeper traps. Due to the raise in density of the deeper traps, the charge carrier mobility in P3HT significantly decreased, as revealed by photo-CELIV measurements, resulting in a loss in mobility of about two orders of magnitude after 100 h exposure to synthetic air. The increased trap density was attributed to p-doping of P3HT by the transfer of an electron to adsorbed oxygen. This effect was partially reversible by applying vacuum to the sample for several hours or, more significantly, by a thermal treatment of the devices in nitrogen atmosphere. The trap states in the methanofullerenes PC61BM, bisPC61BM and PC71BM were investigated by TSC measurements. PC61BM yielded a broad quasi-continuous trap distribution with the maximum of the distribution at about 75 meV. The comparison of the TSC spectra of the three methanofullerenes exhibited significant differences in the trap states with higher activation energies of the most prominent traps in bisPC61BM and PC71BM compared to PC61BM. This probably originates from the different isomers bisPC61BM and PC71BM consist of. Each of the isomers yields different LUMO energies, where the lower ones can act as traps. The lower limit of the trap density of all of the three investigated fullerene derivatives exhibited values in the order of 10^22 m^-3, with the highest for bisPC61BM and the lowest for PC61BM. By applying fractional TSC measurements on P3HT:PC61BM solar cells, it was shown that the trap distribution in the blend is a superposition of the traps in pure P3HT and PC61BM and additional deeper traps in the range of about 250 meV to 400 meV. The origin of these additional traps, which can not be related to the pure materials, was attributed to a higher disorder in the blend and P3HT/PC61BM interfaces. This conclusion was supported by standard TSC and Q-DLTS measurements performed on pristine and annealed P3HT:PC61BM blends, exhibiting a higher ratio of the deep traps in the pristine samples. The lower limit of the trap density of the investigated annealed solar cells was in the range of (6-8)×10^22 m^-3, which was considerably higher than in the pure materials. The influence of oxygen on P3HT:PC61BM solar cells was investigated by exposure of the devices to synthetic air under specific conditions. Exposure of the solar cells to oxygen in the dark resulted in a strong decrease in the power conversion efficiency of 60 \% within 120 h, which was only caused by a loss in short-circuit current. Simultaneous illumination of the solar cells during oxygen exposure strongly accelerated the degradation, resulting in an efficiency loss of 30 \% within only 3 h. Thereby, short-circuit current, open-circuit voltage and fill factor all decreased in the same manner. TSC measurements revealed an increase of the density of deeper traps for both degradation conditions, which resulted in a decrease of the mobility, as investigated by CELIV measurements. However, these effects were less pronounced than in pure P3HT. Furthermore, an increase of the equilibrium charge carrier density with degradation time was observed, which was attributed to oxygen doping of P3HT. With the aid of macroscopic simulations, it was shown that the doping of the solar cells is the origin of the loss in short-circuit current for both degradation conditions.},
  subject      = {Organischer Halbleiter},
  language  = {en}
}