@article{MuellerSpriestersbachMinetal.2022,
  author    = {M{\"u}ller, S. and Spriestersbach, F. and Min, C.-H. and Fornari, C. I. and Reinert, F.},
  title     = {Molecular beam epitaxy of TmTe thin films on SrF\(_{2}\) (111)},
  series = {AIP Advances},
  volume    = {12},
  journal   = {AIP Advances},
  number    = {2},
  doi       = {10.1063/5.0083276},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-300876},
  year      = {2022},
  abstract  = {The odd parity nature of 4f states characterized by strong spin-orbit coupling and electronic correlations has led to a search for novel topological phases among rare earth compounds, such as Kondo systems, heavy Fermions, and homogeneous mixed-valent materials. Our target system is thulium telluride thin films whose bandgap is expected to be tuned as a function of lattice parameter. We systematically investigate the growth conditions of TmxTey thin films on SrF\(_{2}\) (111) substrates by molecular beam epitaxy. The ratio between Te and Tm supply was precisely tuned, resulting in two different crystalline phases, which were confirmed by x-ray diffraction and x-ray photoemission spectroscopy. By investigating the crystalline quality as a function of the substrate temperature, the optimal growth conditions were identified for the desired Tm1Te1 phase. Additional low energy electron diffraction and reflective high energy electron diffraction measurements confirm the epitaxial growth of TmTe layers. X-ray reflectivity measurements demonstrate that homogeneous samples with sharp interfaces can be obtained for varied thicknesses. Our results provide a reliable guidance to prepare homogeneous high-quality TmTe thin films and thus serve as a basis for further electronic investigations.},
  language  = {en}
}
@article{WyborskiPodemskiWrońskietal.2022,
  author    = {Wyborski, Paweł and Podemski, Paweł and Wroński, Piotr Andrzej and Jabeen, Fauzia and H{\"o}fling, Sven and Sęk, Grzegorz},
  title     = {Electronic and optical properties of InAs QDs grown by MBE on InGaAs metamorphic buffer},
  series = {Materials},
  volume    = {15},
  journal   = {Materials},
  number    = {3},
  issn      = {1996-1944},
  doi       = {10.3390/ma15031071},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-297037},
  year      = {2022},
  abstract  = {We present the optical characterization of GaAs-based InAs quantum dots (QDs) grown by molecular beam epitaxy on a digitally alloyed InGaAs metamorphic buffer layer (MBL) with gradual composition ensuring a redshift of the QD emission up to the second telecom window. Based on the photoluminescence (PL) measurements and numerical calculations, we analyzed the factors influencing the energies of optical transitions in QDs, among which the QD height seems to be dominating. In addition, polarization anisotropy of the QD emission was observed, which is a fingerprint of significant valence states mixing enhanced by the QD confinement potential asymmetry, driven by the decreased strain with increasing In content in the MBL. The barrier-related transitions were probed by photoreflectance, which combined with photoluminescence data and the PL temperature dependence, allowed for the determination of the carrier activation energies and the main channels of carrier loss, identified as the carrier escape to the MBL barrier. Eventually, the zero-dimensional character of the emission was confirmed by detecting the photoluminescence from single QDs with identified features of the confined neutral exciton and biexciton complexes via the excitation power and polarization dependences.},
  language  = {en}
}