@phdthesis{Fella2016,
  author    = {Fella, Christian},
  title     = {High-Resolution X-ray Imaging based on a Liquid-Metal-Jet-Source with and without X-ray Optics},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-145938},
  school      = {Universit{\"a}t W{\"u}rzburg},
  year      = {2016},
  abstract  = {With increasing miniaturization in industry and medical technology, non-destructive testing techniques are an area of everincreasing importance. In this framework, X-ray microscopy offers an efficient tool for the analysis, understanding and quality assurance of microscopic species, in particular as it allows reconstructing three-dimensional data sets of the whole sample's volumevia computed tomography (CT). The following thesis describes the conceptualization, design, construction and characterization of a compact laboratory-based X-ray microscope in the hard X-ray regime around 9 keV, corresponding to a wavelength of 0.134 nm. Hereby, the main focus is on the optimization of resolution and contrast at relatively short exposure times. For this, a novel liquid-metal-jet anode source is the basis. Such only recently commercially available X-ray source reaches a higher brightness than other conventional laboratory sources, i.e. the number of emitted photons (X-ray quanta) per area and solid angle is exceptionally high. This is important in order to reach low exposure times. The reason for such high brightness is the usage of the rapidly renewing anode out of liquid metal which enables an effective dissipation of heat, normally limiting the creation of high intensities on a small area. In order to cover a broad range of different samples, the microscope can be operated in two modes. In the "micro-CT mode", small pixels are realized with a crystal-scintillator and an optical microscope via shadow projection geometry. Therefore, the resolution is limited by the emitted wavelength of the scintillator, as well as the blurring of the screen. However, samples in the millimeter range can be scanned routinely with low exposure times. Additionally, this mode is optimized with respect to in-line phase contrast, where edges of an object are enhanced and thus better visible. In the second "nano-CT mode", a higher resolution can be reached via X-ray lenses. However, their production process is due to the physical properties of the hard X-ray range - namely high absorption and low diffraction - extremely difficult, leading typically to low performances. In combination with a low brightness, this leads to long exposure times and high requirements in terms of stability, which is one of the key problems of laboratory-based X-ray microscopy. With the here-developed setup and the high brightness of its source, structures down to 150 nm are resolved at moderate exposure times (several minutes per image) and nano-CTs can be obtained.},
  subject      = {computed tomography},
  language  = {en}
}