@inproceedings{BoegeSchaeferShanjiaetal.1994, author = {Boege, P. and Sch{\"a}fer, H. and Shanjia, Xu and Xinzhang, Wu and Einfeldt, S. and Becker, Charles R. and Hommel, D. and Geick, R.}, title = {Improved conductivity-measurement of semiconductor epitaxial layers by means of the contactless microwave method}, url = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-37763}, year = {1994}, abstract = {Measurements and calculations of the scattering-characteristics of stratified lossy dielectric blocks completely filling a waveguide cross section are presented. The method is used for contactless conductivity measurements of MBE-grown II-VI semiconductor layers.}, subject = {Millimeterwelle}, language = {en} }