@inproceedings{BoegeSchaeferShanjiaetal.1994,
  author    = {Boege, P. and Sch{\"a}fer, H. and Shanjia, Xu and Xinzhang, Wu and Einfeldt, S. and Becker, Charles R. and Hommel, D. and Geick, R.},
  title     = {Improved conductivity-measurement of semiconductor epitaxial layers by means of the contactless microwave method},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-37763},
  year      = {1994},
  abstract  = {Measurements and calculations of the scattering-characteristics of stratified lossy dielectric blocks completely filling a waveguide cross section are presented. The method is used for contactless conductivity measurements of MBE-grown II-VI semiconductor layers.},
  subject      = {Millimeterwelle},
  language  = {en}
}
@article{XuShengGreineretal.1994,
  author    = {Xu, Shanjia and Sheng, Xinqing and Greiner, P. and Becker, Charles R. and Geick, R.},
  title     = {High-order finite-element analysis of scattering properties of II-VI semiconductor materials},
  url       = {http://nbn-resolving.de/urn:nbn:de:bvb:20-opus-86283},
  year      = {1994},
  abstract  = {The sattering characteristics ot the n-VI semiconductors were analyzed by a method which combines the second-order finite-element method with the rigorous mode matching procedure. The method avolds the difficulty of solving the complex transcendental equation introduced in the multimode network method and calculates all the eigenvalues and eigenfunctions simultaneously which are needed for the mode matching treatment in the longitudinal direction. As a result, the whole solution procedure is significantly simplified. A comparison is given between the experimental data and the calculated results obtained with this analysis and tbe network method. Very good agreement has been achieved, the accuracy and efficiency of the present method are thus verified.},
  subject      = {Halbleiter},
  language  = {en}
}