TY  - JOUR
A1  - Rewitz, Christian
A1  - Keitzl, Thomas
A1  - Tuchscherer, Philip
A1  - Goetz, Sebastian
A1  - Geisler, Peter
A1  - Razinskas, Gary
A1  - Hecht, Bert
A1  - Brixner, Tobias
T1  - Spectral-interference microscopy for characterization of functional plasmonic elements
JF  - Optics Express
N2  - Plasmonic modes supported by noble-metal nanostructures offer strong subwavelength electric-field confinement and promise the realization of nanometer-scale integrated optical circuits with well-defined functionality. In order to measure the spectral and spatial response functions of such plasmonic elements, we combine a confocal microscope setup with spectral interferometry detection. The setup, data acquisition, and data evaluation are discussed in detail by means of exemplary experiments involving propagating plasmons transmitted through silver nanowires. By considering and experimentally calibrating any setup-inherent signal delay with an accuracy of 1 fs, we are able to extract correct timing information of propagating plasmons. The method can be applied, e.g., to determine the dispersion and group velocity of propagating plasmons in nanostructures, and can be extended towards the investigation of nonlinear phenomena.
Y1  - 2012
U6  - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-85922
UR  - http://www.opticsinfobase.org/oe/fulltext.cfm?uri=oe-20-13-14632&id=238393
ER  -