TY  - JOUR
A1  - Opolka, Alexander
A1  - Müller, Dominik
A1  - Fella, Christian
A1  - Balles, Andreas
A1  - Mohr, Jürgen
A1  - Last, Arndt
T1  - Multi-lens array full-field X-ray microscopy
JF  - Applied Sciences
N2  - X-ray full-field microscopy at laboratory sources for photon energies above 10 keV suffers from either long exposure times or low resolution. The photon flux is mainly limited by the objectives used, having a limited numerical aperture NA. We show that this can be overcome by making use of the cone-beam illumination of laboratory sources by imaging the same field of view (FoV) several times under slightly different angles using an array of X-ray lenses. Using this technique, the exposure time can be reduced drastically without any loss in terms of resolution. A proof-of-principle is given using an existing laboratory metal-jet source at the 9.25 keV Ga K\(_α\)-line and compared to a ray-tracing simulation of the setup.
KW  - X-ray microscopy
KW  - full-field microscopy
KW  - compound refractive X-ray lenses
KW  - CRLs
Y1  - 2021
U6  - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-244974
SN  - 2076-3417
VL  - 11
IS  - 16
ER  -