TY - JOUR A1 - Zhang, X. F. A1 - Becker, Charles R. A1 - Zhang, H. A1 - He, L. A1 - Landwehr, G. T1 - Investigation of a short period (001) HgTe-Hg\(_{0.6}\)Cd\(_{0.4}\)Te superlattice by transmission electron microscopy N2 - No abstract available Y1 - 1994 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-38029 ER - TY - JOUR A1 - Xu, Shanjia A1 - Sheng, Xinqing A1 - Greiner, P. A1 - Becker, Charles R. A1 - Geick, R. T1 - High-order finite-element analysis of scattering properties of II-VI semiconductor materials N2 - The sattering characteristics ot the n-VI semiconductors were analyzed by a method which combines the second-order finite-element method with the rigorous mode matching procedure. The method avolds the difficulty of solving the complex transcendental equation introduced in the multimode network method and calculates all the eigenvalues and eigenfunctions simultaneously which are needed for the mode matching treatment in the longitudinal direction. As a result, the whole solution procedure is significantly simplified. A comparison is given between the experimental data and the calculated results obtained with this analysis and tbe network method. Very good agreement has been achieved, the accuracy and efficiency of the present method are thus verified. KW - Halbleiter KW - II-VI semiconductor KW - scattering characteristics KW - high-order finite element KW - mode matching method Y1 - 1994 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-86283 ER - TY - JOUR A1 - Wu, Y.S. A1 - Becker, Charles R. A1 - Waag, A. A1 - Kraus, M. M. A1 - Bicknell-Tassius, R. N. A1 - Landwehr, G. T1 - Correlation of the Cd-to-Te ratio on CdTe surfaces with the surface structure N2 - We report here that reconstruction on (100), (1lIlA, and (1l1lB CdTe surfaces is either C(2X2), (2X2), and (l X I) or (2X I), (l X I), and (l X I) when they are Cd or Te stabilized, respectively. There is a mixed region between Cd and Te stabilization in which the reflected high-energy electron-diffraction (RHEED) patterns contain characteristics of both Cd- and Te-stabilized surfaces. We have also found that the Cd-to-Te ratio of the x-ray photoelectron intensities of their 3d\(_{3/ 2}\) core levels is about 20% larger for a Cd-stabilized (1lIlA, (1lIlB, or (100) CdTe surface than for a Te-stabilized one. According to a simple model calculation, which was normalized by means of the photoelectron intensity ratio of a Cd-stabilized (lll)A and aTe-stabilized (1l1lB CdTe surface, the experimental data for CdTe surfaces can be explained by a linear dependence of the photoelectron-intensity ratio on the fraction of Cd in the uppermost monatomic layer. This surface composition can be correlated with the surface structure, i.e., the corresponding RHEED patterns. This correlation can in turn be employed to determine Te and Cd evaporation rates. The Te reevaporation rate is increasingly slower for the Te-stabilized (Ill) A, (l1l)B, and (100) surfaces, while the opposite is true for Cd from Cd-stabilized (Ill) A and (Ill)B surfaces. In addition, Te is much more easily evaporated from all the investigated surfaces than is Cd, if the substrate is kept at normal molecular-beam-epitaxy growth temperatures ranging from 2oo·C to 300 ·C. KW - Festkörperphysik Y1 - 1991 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-37789 SN - 0163-1829 ER - TY - JOUR A1 - Wu, Y. S. A1 - Becker, Charles R. A1 - Waag, A. A1 - von Schierstedt, K. A1 - Bicknell-Tassius, R. N. A1 - Landwehr, G. T1 - Surface sublimation of zinc blende CdTe N2 - The surface sublimation of Cd and Te atoms from the zinc blende (111)A CdTe surface has been investigated in detail by reflection high energy electron diffraction and x-ray photoelectron spectroscopy. These experiments verify that Te is much easier to evaporate than Cd. The experimental value for the Te activation energy from a Te stabilized (111)A CdTe surface is 1.41 ±0.1O eV, which is apparently inconsistent with recent theoretical results. Y1 - 1993 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-37829 ER - TY - JOUR A1 - Wu, Y. S. A1 - Becker, Charles R. A1 - Waag, A. A1 - Schmiedl, R. A1 - Einfeldt, S. A1 - Landwehr, G. T1 - Oxygen on the (100) CdTe surface N2 - We have investigated oxygen on CdTe substrates by means of x-ray photoelectron spectroscopy (XPS) and reflection high-energy electron diffraction (RHEED). A Te oxide layer that was at least 15 A thick was found on the surface of as-delivered CdTe substrates that were mechanically polished. This oxide is not easily evaporated at temperatures lower than 350°C. Furthermore, heating in air, which further oxidizes the CdTe layer, should be avoided. Etching with HCI acid (15% HCl) for at least 20 s and then rinsing with de-ionized water reduces the Te oxide layer on the surface down to 4% of a monoatomic layer. However, according to XPS measurements of the 0 Is peak, 20%-30% of a monoatomic layer of oxygen remains on the surface, which can be eliminated by heating at temperatures ranging between 300 and 340 cC. The RHEED patterns for a molecular beam epitaxially (MBE)-grown CdTe film on a (lOO) CdTe substrate with approximately one monoatomic layer of oxidized Te on the surface lose the characteristics of the normal RHEED pattems for a MBE-grown CdTe film on an oxygen-free CdTe substrate. Y1 - 1993 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-37869 ER - TY - JOUR A1 - Wu, Y. S. A1 - Becker, Charles R. A1 - Waag, A. A1 - Bicknell-Tassius, R. N. A1 - Landwehr, G. T1 - Thermal effects on (100) CdZnTe substrates as studied by x-ray photoelectron spectroscopy and reflection high energy electron diffraction N2 - The influence of different CdZnTe substrate treatments prior to II-VI molecular beam epitaxial growth on surface stoichiometry, oxygen, and carbon contamination has been studied using x-ray photoelectron spectroscopy and reflection high energy electron diffraction. Heating the substrate at 300 °C can eliminate oxygen contamination, but cannot completely remove carbon from the surface. Heating at higher temperatures decreases the carbon contamination only slightly, while increasing the Zn-Cd ratio on the surface considerably. The magnitude of the latter effect is surprising and is crucial when one is using lattice matched CdZnTe (Zn 4%) substrates. Y1 - 1992 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-37801 SN - 0003-6951 ER - TY - JOUR A1 - Wu, Y. S. A1 - Becker, Charles R. A1 - Waag, A. A1 - Bicknell-Tassius, R. N. A1 - Landwehr, G. T1 - Removal of oxygen and reduction of carbon contamination on (100) Cd\(_{0.96}\)Zn\(_{0.04}\)Te N2 - No abstract available Y1 - 1993 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-38014 ER - TY - JOUR A1 - Wu, Y. S. A1 - Becker, Charles R. A1 - Waag, A. A1 - Bicknell-Tassius, R. N. A1 - Landwehr, G. T1 - The effects of laser illumination and high energy electrons on molecular-beam epitaxial growth of CdTe N2 - We report the results of a detailed investigation on the Te-stabilized (2 x 1) and the Cdstabilized c( 2 X 2) surfaces of ( 100) CdTe substrates. The investigation demonstrates for the first time that both laser illumination and, to a greater extent, high-energy electron irradiation increase the Te desorption and reduce the Cd desorption from ( 100) CdTe surfaces. Thus it is possible by choosing the proper growth temperature and photon or electron fluxes to change the surface reconstruction from the normally Te-stabilized to a Cd-stabilized phase. Y1 - 1991 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-30795 ER - TY - JOUR A1 - Waag, A. A1 - Heinke, H. A1 - Scholl, S. A1 - Becker, Charles R. A1 - Landwehr, G. T1 - Growth of MgTe and Cd\(_{1-x}\)Mg\(_x\)Te thin films by molecular beam epitaxy N2 - We report on the growth of the compound semiconductor MgTe as weil as the ternary alloy Cd\(_{l-x}\)Mg, Te by molecular hcam cpitaxy. This is to our knowkdgc thc first time that this material has heen grown by any epitaxial technique. Bulk MgTe, which is hygroscopic, has a band gap of 3.0 eV and crystallizcs usually in thc wurtzite structure. Pseudomorphic films were grown on zincblende Cd Te suhstrates for a MgTe thickness helow a critical layer thickncss of approximately 500 nm. In addition, Cd\(_{l_x}\),Mg\(_x\)Te epilayers were grown with a Mg concentration between 0 and 68%, which corresponds to a band gap betwcen 1.5 and 2.5 eV at room temperature. The crystalline quality of thc layers is comparabk to CdTc thin films as long as they are fully strained. The lauice constant of zincblende MgTe is slightly smaller than that of CdTe, and the lattice mismatch is as low as O.7%. In addition highly n-type CdMgTe layers were fabricatcd by hromine doping. The tunability of the band gap as weil as the rather good laUice match with CdTc makes the matcrial interesting for optoelectronic device applications for the entire visible range. Y1 - 1993 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-37917 ER - TY - JOUR A1 - Unkelbach, K. H. A1 - Becker, Charles R. A1 - Köhler, H. A1 - Middendorff, A. V. T1 - Optical Phonons of Bi\(_2\)Te\(_3\) N2 - No abstract available Y1 - 1973 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-30809 ER - TY - JOUR A1 - Tönnies, D. A1 - Bacher, G. A1 - Forchel, Alfred A1 - Waag, A. A1 - Litz, Th. A1 - Hommel, D. A1 - Becker, Charles R. A1 - Landwehr, G. A1 - Heuken, M. A1 - Scholl, M. T1 - Optical study of interdiffusion in CdTe and ZnSe based quantum wells N2 - No abstract available Y1 - 1994 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-37750 ER - TY - JOUR A1 - Tacke, M. A1 - Schuberth, W. A1 - Becker, Charles R. A1 - Haas, L. D. T1 - The dielectric constant of PbTe at 4.2 K and \(\tilde ν\)=84.15 cm\(^{-1}\), 96.97 cm\(^{-1}\), 103.60 cm\(^{-1}\) N2 - The dielectric constant of a PbTe epitaxial layer has been measured by surface wave spectroscopy using an optically pumped far-infrared laser and the technique of attenuated total reflection. Y1 - 1982 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-30821 ER - TY - JOUR A1 - Shanjia, Xu A1 - Xinzhang, Wu A1 - Greiner, P. A1 - Becker, Charles R. A1 - Geick, R. T1 - Microwave transmission and reflection of stratified lossy dielectric segments partially filled waveguide N2 - The microwave transmission and reßection is evaluated for stratified lossy dielectric segments partially filling the rectangular waveguide by the method which combines the multimode network theory with the rigorous mode matching procedure. As an example, we investigate in detail the microwave scattering properties of II-VI-epitaxial layer on a lossy dielectric substrate inserted in the rectangular waveguide. The experimental data verify the accuracy and the effectiveness of the present method. Extensive numerical results are presented to establish useful guidelines for the contactless microwave measurement of the conductivity of the epitaxiallayer. Y1 - 1992 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-37958 ER - TY - JOUR A1 - Shanjia, Xu A1 - Xinzhang, Wu A1 - Boege, P. A1 - Schäfer, H. A1 - Becker, Charles R. A1 - Geick, R. T1 - Scattering characteristics of 3-D discontinuity consisting of semiconductor sample filled in waveguide with gaps N2 - No abstract available Y1 - 1993 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-37964 ER - TY - JOUR A1 - Schubert, D.W. A1 - Kraus, M.M A1 - Kenklies, R. A1 - Becker, Charles R. A1 - Bicknell-Tassius, R.N. T1 - Composition and wavelength dependence of the refractive index in Cd\(_{1-x}\)Mn\(_x\)Te epitaxial layers N2 - We have investigated Cd\(_{1-x}\)Mn\(_x\)Te thin films with Mn concentrations of x=0.12, 0.18, 0.30, 0.52, and 0.70. These single crystal layers were grown by molecular beam epitaxy on [001] CdTe substrates. The real part of the refractive index, n, was determined below the band-gap Eo in the range of 0.5-2.5 eV at T=300 K. The parallel reOectivity was measured near the Brewster angle at the YAG laser wavelength of 1.064 J.Lm (hv= 1.165 eV). Combining these results with the optical pathlength results (nd) of reOection measurements in a Fourier spectrometer we have determined n(x,v) over a wide spectral range by utilizing a three parameter fit. The accuracy of these results for n should improve waveguide designs based on this material. Y1 - 1992 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-37716 ER - TY - JOUR A1 - Schikora, D. A1 - Hausleitner, H. A1 - Einfeldt, S. A1 - Becker, Charles R. A1 - Widmer, T. A1 - Giftige, C. A1 - Lischka, K. A1 - von Ortenburg, M. A1 - Landwehr, G. T1 - Epitaxial overgrowth of II-VI compounds on patterned substrates N2 - The selected area epitaxial overgrowth of narrow gap HgTe as well as wide gap CdTe and ZnTe on CdTe/GaAs substrates, which had been structured by dry etching techniques, has been investigated. A plasma etching process using a barrel reactor with CH\(_4\)-CH\(_2\) gases has been employed to prepare stripes with a width of about 1 μm with anisotropic as well as isotropic etching profiles. It has been found, that the selected area HgTe overgrowth takes place with a high local selectivity to the low index planes of the patterned surface. In contrast, the selected area overgrowth of the wide gap CdTe and ZnTe is controlled by anisotropic growth kinetics provided that the substrate temperature is not lower than 220°C and the starting surface consists of well developed low index crystallographic planes. Y1 - 1994 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-37985 ER - TY - JOUR A1 - Rösch, M. A1 - Atzmüller, R. A1 - Schaack, G. A1 - Becker, Charles R. T1 - Resonant Raman scattering in a zero-gap semiconductor: Interference effects and deformation potentials at the E\(_1\) and E\(_1\) + \(\Delta_1\) gaps of HgTe N2 - No abstract available Y1 - 1994 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-38062 ER - TY - JOUR A1 - Qiu, Yueming A1 - He, Li A1 - Li, Jie A1 - Yuan, Shixin A1 - Becker, Charles R. A1 - Landwehr, G. T1 - Infrared photoconductor fabricated with HgTe/CdTe superlattice grown by molecular beam epitaxy N2 - An infrared photoconductor fabricated with a HgTe/CdTe superlattice grown on a GaAs substrate by molecular beam epitaxy is described here for the first time. The growth procedure, device fabrication, and measurement results are described. The results show that the device has relatively high uniformity and 1000 K black-body detectivity 2.4 X 10\(^9\) cm Hz\(^{1/2}\) W\(^{-1}\) . The photoconductivity decay method was used for determining carrier lifetime of the HgTe/CdTe superlattice, the measured lifetime is 12\(\mu\)s at 77 K, which is the longest lifetime ever reported for HgTe/CdTe superlattices and we believe that the increase of lifetime is mainly due to the reduction of dimensions. Y1 - 1993 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-37772 ER - TY - JOUR A1 - Köhler, H. A1 - Becker, Charles R. T1 - Optically active lattice vibrations in Bi\(_2\)Se\(_3\) N2 - The preparation of Bi2Sea single crystals with low free carrier densities allowed an investigation of the lattice vibrations to be carried out from the reflectivity of cleavage planes at nearly normal incidence of the radiation (E ~ c). The experimental results ean be explained with two classical oscillators, whose eigenfrequencies oceur at 92 and 69.5 cm-I. The static dielectric constant was determined to be 100 ± 10 for E ~ c. N2 - Die Praparation von Bi2Se3-Einkristallen mit niedriger Konzentration freier Ladungstrager erlaubte die Untersllchung der Gitterschwingungcn aus dem Reflexionsvermogen von Spaltflaclwn bci nahezu senkreehter Inzidenz der Stmhlung (E ~ c). Die .:\'IeBergebnisse konnen mit zwei klassischen Dispersionsoszillatoren erklart werden, deren Eigenfrequenzen bei 92 und 69,5 cm- I liegen. Dic st,atische Dielektrizitatskonstante wurde zu 100 ± 10 für E ~ c bestimmt. Y1 - 1974 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-31296 ER - TY - JOUR A1 - Köhler, H. A1 - Becker, Charles R. T1 - Infrared-active lattice vibrations in SnSe\(_2\) N2 - No abstract available Y1 - 1976 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-30838 ER -