TY - JOUR A1 - Noyalet, Laurent A1 - Ilgen, Lukas A1 - Bürklein, Miriam A1 - Shehata-Dieler, Wafaa A1 - Taeger, Johannes A1 - Hagen, Rudolf A1 - Neun, Tilmann A1 - Zabler, Simon A1 - Althoff, Daniel A1 - Rak, Kristen T1 - Vestibular aqueduct morphology and Meniere’s disease - development of the vestibular aqueduct score by 3D analysis JF - Frontiers in Surgery N2 - Improved radiological examinations with newly developed 3D models may increase understanding of Meniere's disease (MD). The morphology and course of the vestibular aqueduct (VA) in the temporal bone might be related to the severity of MD. The presented study explored, if the VA of MD and non-MD patients can be grouped relative to its angle to the semicircular canals (SCC) and length using a 3D model. Scans of temporal bone specimens (TBS) were performed using micro-CT and micro flat panel volume computed tomography (mfpVCT). Furthermore, scans were carried out in patients and TBS by computed tomography (CT). The angle between the VA and the three SCC, as well as the length of the VA were measured. From these data, a 3D model was constructed to develop the vestibular aqueduct score (VAS). Using different imaging modalities it was demonstrated that angle measurements of the VA are reliable and can be effectively used for detailed diagnostic investigation. To test the clinical relevance, the VAS was applied on MD and on non-MD patients. Length and angle values from MD patients differed from non-MD patients. In MD patients, significantly higher numbers of VAs could be assigned to a distinct group of the VAS. In addition, it was tested, whether the outcome of a treatment option for MD can be correlated to the VAS. KW - vestibular aqueduct (VA) KW - 3D analysis KW - temporal bone KW - saccotomy KW - computed tomography KW - Meniere’s disease Y1 - 2022 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-312893 SN - 2296-875X VL - 9 ER - TY - THES A1 - Ullherr, Maximilian T1 - Optimization of Image Quality in High-Resolution X-Ray Imaging T1 - Optimierung von Bildqualität in der hochauflösenden Röntgenbildgebung N2 - The SNR spectra model and measurement method developed in this work yield reliable application-specific optima for image quality. This optimization can either be used to understand image quality, find out how to build a good imaging device or to (automatically) optimize the parameters of an existing setup. SNR spectra are here defined as a fraction of power spectra instead of a product of device properties. In combination with the newly developed measurement method for this definition, a close correspondence be- tween theory and measurement is achieved. Prior approaches suffer from a focus on theoretical definitions without fully considering if the defined quantities can be measured correctly. Additionally, discrepancies between assumptions and reality are common. The new approach is more reliable and complete, but also more difficult to evaluate and interpret. The signal power spectrum in the numerator of this fraction allows to model the image quality of different contrast mechanisms that are used in high-resolution x-ray imaging. Superposition equations derived for signal and noise enable understanding how polychromaticity (or superposition in general) affects the image quality. For the concept of detection energy weighting, a quantitative model for how it affects im- age quality was found. It was shown that—depending on sample properties—not detecting x-ray photons can increase image quality. For optimal computational energy weighting, more general formula for the optimal weight was found. In addition to the signal strength, it includes noise and modulation transfer. The novel method for measuring SNR spectra makes it possible to experimentally optimize image quality for different contrast mechanisms. This method uses one simple measurement to obtain a measure for im- age quality for a specific experimental setup. Comparable measurement methods typically require at least three more complex measurements, where the combination may then give a false result. SNR spectra measurements can be used to: • Test theoretical predictions about image quality optima. • Optimize image quality for a specific application. • Find new mechanisms to improve image quality. The last item reveals an important limitation of x- ray imaging in general: The achievable image quality is limited by the amount of x-ray photons interacting with the sample, not by the amount incident per detector area (see section 3.6). If the rest of the imaging geometry is fixed, moving the detector only changes the field of view, not the image quality. A practical consequence is that moving the sample closer to the x-ray source increases image quality quadratically. The results of a SNR spectra measurement represent the image quality only on a relative scale, but very reliable. This relative scale is sufficient for an optimization problem. Physical effects are often already clearly identifiable by the shape of the functional relationship between input parameter and measurement result. SNR spectra as a quantity are not well suited for standardization, but instead allow a reliable optimization. Not satisfying the requirements of standardization allows to use methods which have other advantages. In this case, the SNR spectra method describes the image quality for a specific application. Consequently, additional physical effects can be taken into account. Additionally, the measurement method can be used to automate the setting of optimal machine parameters. The newly proposed image quality measure detection effectiveness is better suited for standardization or setup comparison. This quantity is very similar to measures from other publications (e.g. CNR(u)), when interpreted monochromatically. Polychromatic effects can only be modeled fully by the DE(u). The measurement processes of both are different and the DE(u) is fundamentally more reliable. Information technology and digital data processing make it possible to determine SNR spectra from a mea- sured image series. This measurement process was designed from the ground up to use these technical capabilities. Often, information technology is only used to make processes easier and more exact. Here, the whole measurement method would be infeasible without it. As this example shows, using the capabilities of digital data processing much more extensively opens many new possibilities. Information technology can be used to extract information from measured data in ways that analog data processing simply cannot. The original purpose of the SNR spectra optimization theory and methods was to optimize high resolution x-ray imaging only. During the course of this work, it has become clear that some of the results of this work affect x-ray imaging in general. In the future, these results could be applied to MI and NDT x-ray imaging. Future work on the same topic will also need to consider the relationship between SNR spectra or DE(u) and sufficient image quality.This question is about the minimal image quality required for a specific measurement task. N2 - Das in dieser Arbeit entwickelte Modell und die Messmethode für SNR Spektren ergeben zuverlässige anwendungsspezifische Optima für die Bildqualität. Diese Optimierung kann verwendet werden, entweder um Bildqualität zu verstehen, um herauszufinden wie ein gutes Bildgebungsgerät gebaut werden kann oder um die Parameter eines existierenden Aufbaus (automatisch) festzulegen. ... KW - Bildqualität KW - Bildgebendes Verfahren KW - Computertomografie KW - x-ray imaging KW - x-ray microscopy KW - image quality KW - signal to noise ratio KW - computed tomography KW - x-ray inline phase contrast Y1 - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-231171 ER - TY - THES A1 - Fella, Christian T1 - High-Resolution X-ray Imaging based on a Liquid-Metal-Jet-Source with and without X-ray Optics T1 - Hochauflösende Röntgenbildgebung auf Basis einer Flüssigmetall-Anoden-Quelle mit und ohne Röntgenoptiken N2 - With increasing miniaturization in industry and medical technology, non-destructive testing techniques are an area of everincreasing importance. In this framework, X-ray microscopy offers an efficient tool for the analysis, understanding and quality assurance of microscopic species, in particular as it allows reconstructing three-dimensional data sets of the whole sample’s volumevia computed tomography (CT). The following thesis describes the conceptualization, design, construction and characterization of a compact laboratory-based X-ray microscope in the hard X-ray regime around 9 keV, corresponding to a wavelength of 0.134 nm. Hereby, the main focus is on the optimization of resolution and contrast at relatively short exposure times. For this, a novel liquid-metal-jet anode source is the basis. Such only recently commercially available X-ray source reaches a higher brightness than other conventional laboratory sources, i.e. the number of emitted photons (X-ray quanta) per area and solid angle is exceptionally high. This is important in order to reach low exposure times. The reason for such high brightness is the usage of the rapidly renewing anode out of liquid metal which enables an effective dissipation of heat, normally limiting the creation of high intensities on a small area. In order to cover a broad range of different samples, the microscope can be operated in two modes. In the “micro-CT mode”, small pixels are realized with a crystal-scintillator and an optical microscope via shadow projection geometry. Therefore, the resolution is limited by the emitted wavelength of the scintillator, as well as the blurring of the screen. However, samples in the millimeter range can be scanned routinely with low exposure times. Additionally, this mode is optimized with respect to in-line phase contrast, where edges of an object are enhanced and thus better visible. In the second “nano-CT mode”, a higher resolution can be reached via X-ray lenses. However, their production process is due to the physical properties of the hard X-ray range - namely high absorption and low diffraction - extremely difficult, leading typically to low performances. In combination with a low brightness, this leads to long exposure times and high requirements in terms of stability, which is one of the key problems of laboratory-based X-ray microscopy. With the here-developed setup and the high brightness of its source, structures down to 150 nm are resolved at moderate exposure times (several minutes per image) and nano-CTs can be obtained. N2 - Mit zunehmender Miniaturisierung in Industrie und Medizintechnik werden zerstörungsfreie Prüfverfahren immer wichtiger. In diesem Umfeld bietet Röntgenmikroskopie ein effizientes Instrument zu Analyse, Verständnis und Qualitätssicherung mikroskopischer Proben, insbesondere da sie im Rahmen der Computer-Tomografie (CT) die Aufnahme dreidimensionaler Datensätze des gesamten Probenvolumens ermöglicht. Die vorliegende Arbeit befasst sich mit Konzeption, Design, Aufbau und Charakterisierung eines kompakten Labor-Röntgenmikroskops im harten Röntgenbereich bei 9 keV, bzw. einer Wellenlänge von 0.134 nm. Im Fokus liegt dabei die Optimierung von Auflösung und Kontrast bei möglichst kurzen Belichtungszeiten. Hier für bildet die Basis eine neuartige Flüssig-Metall- Anoden Röntgenquelle. Solche erst seit kurzem kommerziell verfügbare Quellen erreichen eine höhere Brillianz als konventionelle Laborquellen, d.h. dass die Anzahl der emittierten Photonen (Röntgenquanten) pro Fläche und Raumwinkel außergewöhnlich hoch ist. Dies ist ein entscheidender Faktor, um nötige Belichtungszeiten zu verringern. Der Grund für die hohe Brillianz ist die Verwendung einer sich sehr schnell erneuernden Anode aus flüssigem Metall. Diese ermöglicht die effektive Abfuhr von Wärme, welche normalerweise die Erzeugung von höheren Intensitäten auf kleinerer Fläche limitiert. Um ein möglichst großes Spektrum an Proben abzubilden, kann das Mikroskop in zwei Modi betrieben werden. Im ”Mikro-CT Modus“ werden kleine Pixel mit Hilfe eines Kristall-Leuchtschirms und einem Lichtmikroskop über das Schattenwurfprinzip erreicht, weswegen dessen Auflösung durch die Wellenlänge des emittierten Lichts und die Unschärfe des Schirms beschränkt ist. Dafür können Proben im Millimeterbereich bei geringen Belichtungszeiten standardmäßig aufgenommen werden. Zudem wurde dieser Modus auf inline Phasen-Kontrast optimiert, bei welchem die Kanten eines Objekts durch Interferenz überhöht dargestellt werden und somit besser sichtbar sind. Im zweiten ”Nano-CT Modus“ kann eine erhöhte Auflösung mit Hilfe von Röntgenlinsen erreicht werden. Deren Herstellung ist aber aufgrund der physikalische Eigenschaften im harten Röntgenbereichs - nämlich starke Absorption und schwache Brechung - technisch extrem schwierig und meist mit einer sehr geringe optischen “Leistung” verbunden. Dies führt in Kombination mit einer geringen Brillianz zu sehr langen Belichtungszeiten und hohen Anforderungen an die Stabilität, was ein Kernproblem der auf Laborquellen basierenden Röntgenmikroskope darstellt. Mit der hier entwickelten Anlage können durch die hohe Brillianz der verwendeten Quelle bei moderaten Belichtungszeiten (wenige Minuten pro Bild) Strukturen der Größe 150 nm voneinander getrennt, sowie Nano-CTs aufgenommen werden. KW - computed tomography KW - non-destructive testing KW - X-ray microscopy KW - computed tomography (CT) KW - liquid-metal-jet anode X-ray source Y1 - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-145938 ER -