TY  - JOUR
A1  - He, Tao
A1  - Wu, Yanfei
A1  - D'Avino, Gabriele
A1  - Schmidt, Elliot
A1  - Stolte, Matthias
A1  - Cornil, Jérôme
A1  - Beljonne, David
A1  - Ruden, P. Paul
A1  - Würthner, Frank
A1  - Frisbie, C. Daniel
T1  - Crystal step edges can trap electrons on the surfaces of n-type organic semiconductors
JF  - Nature Communications
N2  - Understanding relationships between microstructure and electrical transport is an important goal for the materials science of organic semiconductors. Combining high-resolution surface potential mapping by scanning Kelvin probe microscopy (SKPM) with systematic field effect transport measurements, we show that step edges can trap electrons on the surfaces of single crystal organic semiconductors. n-type organic semiconductor crystals exhibiting positive step edge surface potentials display threshold voltages that increase and carrier mobilities that decrease with increasing step density, characteristic of trapping, whereas crystals that do not have positive step edge surface potentials do not have strongly step density dependent transport. A device model and microelectrostatics calculations suggest that trapping can be intrinsic to step edges for crystals of molecules with polar substituents. The results provide a unique example of a specific microstructure–charge trapping relationship and highlight the utility of surface potential imaging in combination with transport measurements as a productive strategy for uncovering microscopic structure–property relationships in organic semiconductors.
KW  - electronic and spintronic devices
KW  - electronic devices
KW  - scanning probe microscopy
Y1  - 2018
U6  - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:bvb:20-opus-227957
VL  - 9
ER  -