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High-order finite-element analysis of scattering properties of II-VI semiconductor materials

Please always quote using this URN: urn:nbn:de:bvb:20-opus-86283
  • The sattering characteristics ot the n-VI semiconductors were analyzed by a method which combines the second-order finite-element method with the rigorous mode matching procedure. The method avolds the difficulty of solving the complex transcendental equation introduced in the multimode network method and calculates all the eigenvalues and eigenfunctions simultaneously which are needed for the mode matching treatment in the longitudinal direction. As a result, the whole solution procedure is significantly simplified. A comparison is givenThe sattering characteristics ot the n-VI semiconductors were analyzed by a method which combines the second-order finite-element method with the rigorous mode matching procedure. The method avolds the difficulty of solving the complex transcendental equation introduced in the multimode network method and calculates all the eigenvalues and eigenfunctions simultaneously which are needed for the mode matching treatment in the longitudinal direction. As a result, the whole solution procedure is significantly simplified. A comparison is given between the experimental data and the calculated results obtained with this analysis and tbe network method. Very good agreement has been achieved, the accuracy and efficiency of the present method are thus verified.show moreshow less

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Metadaten
Author: Shanjia Xu, Xinqing Sheng, P. Greiner, Charles R. Becker, R. Geick
URN:urn:nbn:de:bvb:20-opus-86283
Document Type:Journal article
Faculties:Fakultät für Physik und Astronomie / Physikalisches Institut
Language:English
Year of Completion:1994
Source:Chinese Journal of Infrared and Millimeter Waves, 1994, 12, 3, 201-209
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
GND Keyword:Halbleiter
Tag:II-VI semiconductor; high-order finite element; mode matching method; scattering characteristics
Release Date:2014/06/12
Licence (German):License LogoDeutsches Urheberrecht