The dielectric constant of PbTe at 4.2 K and \(\tilde ν\)=84.15 cm\(^{-1}\), 96.97 cm\(^{-1}\), 103.60 cm\(^{-1}\)
Please always quote using this URN: urn:nbn:de:bvb:20-opus-30821
- The dielectric constant of a PbTe epitaxial layer has been measured by surface wave spectroscopy using an optically pumped far-infrared laser and the technique of attenuated total reflection.
Author: | M. Tacke, W. Schuberth, Charles R. Becker, L. D. Haas |
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URN: | urn:nbn:de:bvb:20-opus-30821 |
Document Type: | Journal article |
Faculties: | Fakultät für Physik und Astronomie / Physikalisches Institut |
Language: | English |
Year of Completion: | 1982 |
Source: | Appl. Phys. A (1982) 28, 229-233. |
Dewey Decimal Classification: | 5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik |
Release Date: | 2009/09/05 |