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Shaping and spatiotemporal characterization of sub-10-fs pulses focused by a high-NA objective

Please always quote using this URN: urn:nbn:de:bvb:20-opus-111120
  • We describe a setup consisting of a 4 f pulse shaper and a microscope with a high-NA objective lens and discuss the spects most relevant for an undistorted spatiotemporal profile of the focused beam. We demonstrate shaper-assisted pulse compression in focus to a sub-10-fs duration using phase-resolved interferometric spectral modulation (PRISM). We introduce a nanostructure-based method for sub-diffraction spatiotemporal characterization of strongly focused pulses. The distortions caused by optical aberrations and space–time coupling from theWe describe a setup consisting of a 4 f pulse shaper and a microscope with a high-NA objective lens and discuss the spects most relevant for an undistorted spatiotemporal profile of the focused beam. We demonstrate shaper-assisted pulse compression in focus to a sub-10-fs duration using phase-resolved interferometric spectral modulation (PRISM). We introduce a nanostructure-based method for sub-diffraction spatiotemporal characterization of strongly focused pulses. The distortions caused by optical aberrations and space–time coupling from the shaper can be reduced by careful setup design and alignment to about 10 nm in space and 1 fs in time.show moreshow less

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Metadaten
Author: Tobias Brixner, Monika Pawłowska, Sebastian Goetz, Christian Dreher, Matthias Wurdack, Enno Krauss, Gary Razinskas, Peter Geisler, Bert Hecht
URN:urn:nbn:de:bvb:20-opus-111120
Document Type:Journal article
Faculties:Fakultät für Physik und Astronomie / Physikalisches Institut
Fakultät für Chemie und Pharmazie / Institut für Physikalische und Theoretische Chemie
Language:English
Year of Completion:2014
Source:Optics Express 22, 25 (2014), 31496 - 31510, doi 10.1364/OE.22.031496
DOI:https://doi.org/10.1364/OE.22.031496
Sonstige beteiligte Institutionen:Röntgen Center for Complex Material Systems (RCCM), Am Hubland, 97074 W¨urzburg, Germany
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 54 Chemie / 541 Physikalische Chemie
Tag:Interference microscopy; Pulse shaping; Scanning microscopy; Subwavelength structures; Ultrafast measurements; nanostructures
Release Date:2015/03/27
Collections:Open-Access-Publikationsfonds / Förderzeitraum 2014
Licence (German):License LogoDeutsches Urheberrecht