Shaping and spatiotemporal characterization of sub-10-fs pulses focused by a high-NA objective
Please always quote using this URN: urn:nbn:de:bvb:20-opus-111120
- We describe a setup consisting of a 4 f pulse shaper and a microscope with a high-NA objective lens and discuss the spects most relevant for an undistorted spatiotemporal profile of the focused beam. We demonstrate shaper-assisted pulse compression in focus to a sub-10-fs duration using phase-resolved interferometric spectral modulation (PRISM). We introduce a nanostructure-based method for sub-diffraction spatiotemporal characterization of strongly focused pulses. The distortions caused by optical aberrations and space–time coupling from theWe describe a setup consisting of a 4 f pulse shaper and a microscope with a high-NA objective lens and discuss the spects most relevant for an undistorted spatiotemporal profile of the focused beam. We demonstrate shaper-assisted pulse compression in focus to a sub-10-fs duration using phase-resolved interferometric spectral modulation (PRISM). We introduce a nanostructure-based method for sub-diffraction spatiotemporal characterization of strongly focused pulses. The distortions caused by optical aberrations and space–time coupling from the shaper can be reduced by careful setup design and alignment to about 10 nm in space and 1 fs in time.…
Author: | Tobias Brixner, Monika Pawłowska, Sebastian Goetz, Christian Dreher, Matthias Wurdack, Enno Krauss, Gary Razinskas, Peter Geisler, Bert Hecht |
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URN: | urn:nbn:de:bvb:20-opus-111120 |
Document Type: | Journal article |
Faculties: | Fakultät für Physik und Astronomie / Physikalisches Institut |
Fakultät für Chemie und Pharmazie / Institut für Physikalische und Theoretische Chemie | |
Language: | English |
Year of Completion: | 2014 |
Source: | Optics Express 22, 25 (2014), 31496 - 31510, doi 10.1364/OE.22.031496 |
DOI: | https://doi.org/10.1364/OE.22.031496 |
Sonstige beteiligte Institutionen: | Röntgen Center for Complex Material Systems (RCCM), Am Hubland, 97074 W¨urzburg, Germany |
Dewey Decimal Classification: | 5 Naturwissenschaften und Mathematik / 54 Chemie / 541 Physikalische Chemie |
Tag: | Interference microscopy; Pulse shaping; Scanning microscopy; Subwavelength structures; Ultrafast measurements; nanostructures |
Release Date: | 2015/03/27 |
Collections: | Open-Access-Publikationsfonds / Förderzeitraum 2014 |
Licence (German): | Deutsches Urheberrecht |