The orientation independence of the CdTe-HgTe valence band offset as determined by x-ray photoelectron spectroscopy

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Author: Charles R. Becker, Y. S. Wu, A. Waag, M. M. Kraus, G. Landwehr
Document Type:Journal article
Faculties:Fakultät für Physik und Astronomie / Physikalisches Institut
Year of Completion:1991
Source:In: Semicond. Sci. Technol. (1991) 6, C76-C79.
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Release Date:2009/01/08