Investigation of a short period (001) HgTe-Hg\(_{0.6}\)Cd\(_{0.4}\)Te superlattice by transmission electron microscopy

Please always quote using this URN: urn:nbn:de:bvb:20-opus-38029

Download full text files

Export metadata

Additional Services

Share in Twitter Search Google Scholar Statistics
Author: X. F. Zhang, Charles R. Becker, H. Zhang, L. He, G. Landwehr
Document Type:Journal article
Faculties:Fakultät für Physik und Astronomie / Physikalisches Institut
Year of Completion:1994
Source:Semiconductor science and technology (1994) 9, 2217-2223.
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Release Date:2009/09/16