Laboratory-Based Nano-Computed Tomography and Examples of Its Application in the Field of Materials Research

Please always quote using this URN: urn:nbn:de:bvb:20-opus-241048
  • In a comprehensive study, we demonstrate the performance and typical application scenarios for laboratory-based nano-computed tomography in materials research on various samples. Specifically, we focus on a projection magnification system with a nano focus source. The imaging resolution is quantified with common 2D test structures and validated in 3D applications by means of the Fourier Shell Correlation. As representative application examples from nowadays material research, we show metallization processes in multilayer integrated circuits,In a comprehensive study, we demonstrate the performance and typical application scenarios for laboratory-based nano-computed tomography in materials research on various samples. Specifically, we focus on a projection magnification system with a nano focus source. The imaging resolution is quantified with common 2D test structures and validated in 3D applications by means of the Fourier Shell Correlation. As representative application examples from nowadays material research, we show metallization processes in multilayer integrated circuits, aging in lithium battery electrodes, and volumetric of metallic sub-micrometer fillers of composites. Thus, the laboratory system provides the unique possibility to image non-destructively structures in the range of 170–190 nanometers, even for high-density materials.show moreshow less

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Metadaten
Author: Dominik Müller, Jonas Graetz, Andreas Balles, Simon Stier, Randolf Hanke, Christian Fella
URN:urn:nbn:de:bvb:20-opus-241048
Document Type:Journal article
Faculties:Fakultät für Physik und Astronomie / Physikalisches Institut
Language:English
Parent Title (English):Crystals
ISSN:2073-4352
Year of Completion:2021
Volume:11
Issue:6
Article Number:677
Source:Crystals 2021, 11(6), 677; https://doi.org/10.3390/cryst11060677
DOI:https://doi.org/10.3390/cryst11060677
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Tag:3D X-ray microscopy; 3D reconstruction; X-ray; instrumentation; integrated circuits; laboratory; nano CT; nondestructive testing
Release Date:2022/01/10
Date of first Publication:2021/06/12
Open-Access-Publikationsfonds / Förderzeitraum 2021
Licence (German):License LogoCC BY: Creative-Commons-Lizenz: Namensnennung 4.0 International