Spectral-interference microscopy for characterization of functional plasmonic elements

Please always quote using this URN: urn:nbn:de:bvb:20-opus-85922
  • Plasmonic modes supported by noble-metal nanostructures offer strong subwavelength electric-field confinement and promise the realization of nanometer-scale integrated optical circuits with well-defined functionality. In order to measure the spectral and spatial response functions of such plasmonic elements, we combine a confocal microscope setup with spectral interferometry detection. The setup, data acquisition, and data evaluation are discussed in detail by means of exemplary experiments involving propagating plasmons transmitted throughPlasmonic modes supported by noble-metal nanostructures offer strong subwavelength electric-field confinement and promise the realization of nanometer-scale integrated optical circuits with well-defined functionality. In order to measure the spectral and spatial response functions of such plasmonic elements, we combine a confocal microscope setup with spectral interferometry detection. The setup, data acquisition, and data evaluation are discussed in detail by means of exemplary experiments involving propagating plasmons transmitted through silver nanowires. By considering and experimentally calibrating any setup-inherent signal delay with an accuracy of 1 fs, we are able to extract correct timing information of propagating plasmons. The method can be applied, e.g., to determine the dispersion and group velocity of propagating plasmons in nanostructures, and can be extended towards the investigation of nonlinear phenomena.show moreshow less

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Metadaten
Author: Christian Rewitz, Thomas Keitzl, Philip Tuchscherer, Sebastian Goetz, Peter Geisler, Gary Razinskas, Bert Hecht, Tobias Brixner
URN:urn:nbn:de:bvb:20-opus-85922
Document Type:Journal article
Faculties:Fakultät für Chemie und Pharmazie / Institut für Physikalische und Theoretische Chemie
Language:English
Parent Title (English):Optics Express
Year of Completion:2012
Source:In: Optics Express (2012) 20: 13, 14632-14647, doi:10.1364/OE.20.014632
URL:http://www.opticsinfobase.org/oe/fulltext.cfm?uri=oe-20-13-14632&id=238393
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 54 Chemie / 540 Chemie und zugeordnete Wissenschaften
Release Date:2014/05/12
Collections:Open-Access-Publikationsfonds / Förderzeitraum 2012
Licence (German):License LogoDeutsches Urheberrecht