In order to shrink the size of semiconductor devices and improve their efficiency at the same time, silicon-based semiconductor devices have been engineered, until the material almost reaches its performance limits. As the candidate to be used next in semiconducting devices, single-wall carbon nanotubes show a great potential due to their promise of increased device efficiency and their high charge carrier mobilities in the nanometer size active areas. However, there are material based problems to overcome in order to imply SWNTs in the semiconductor devices. SWNTs tend to aggregate in bundles and it is not trivial to obtain an electronically or chirally homogeneous SWNT dispersion and when it is done, a homogeneous thin film needs to be produced with a technique that is practical, easy and scalable. This work was aimed to solve both of these problems. In the first part of this study, six different polymers, containing fluorene or carbazole as the rigid part and bipyridine, bithiophene or biphenyl as the accompanying copolymer unit, were used to selectively disperse semiconducting SWNTs. With the data obtained from absorption and photoluminescence spectroscopy of the corresponding dispersions, it was found out that the rigid part of the copolymer plays a primary role in determining its dispersion efficiency and electronic sorting ability. Within the two tested units, carbazole has a higher π electron density. Due to increased π−π interactions, carbazole containing copolymers have higher dispersion efficiency. However, the electronic sorting ability of fluorene containing polymers is superior. Chiral selection of the polymers in the dispersion is not directly foreseeable from the selection of backbone units. At the end, obtaining a monochiral dispersion is found to be highly dependent on the used raw material in combination to the preferred polymer. Next, one of the best performing polymers due to high chirality enrichment and electronic sorting ability was chosen in order to disperse SWNTs. Thin films of varying thickness between 18 ± 5 to 755o±o5 nm were prepared using vacuum filtration wet transfer method in order to analyze them optically and electronically. The scalability and efficiency of the integrated thin film production method were shown using optical, topographical and electronic measurements. The relative photoluminescence quantum yield of the radiative decay from the SWNT thin films was found to be constant for the thickness scale. Constant roughness on the film surface and linearly increasing concentration of SWNTs were also supporting the scalability of this thin film production method. Electronic measurements on bottom gate top contact transistors have shown an increasing charge carrier mobility for linear and saturation regimes. This was caused by the missing normalization of the mobility for the thickness of the active layer. This emphasizes the importance of considering this dimension for comparison of different field effect transistor mobilities.