61.05.-a Techniques for structure determination; Microscopy of surfaces, interfaces, and thin films, see 68.37.-d
- 61.05.C- X-ray diffraction and scattering (for x-ray diffractometers, see 07.85.Jy; for x-ray studies of crystal defects, see 61.72.Dd, Ff) (3)
- 61.05.F- Neutron diffraction and scattering
- 61.05.J- Electron diffraction and scattering (for electron diffractometers, see 07.78.+s) (2)
- 61.05.Np Atom, molecule, and ion scattering (for structure determination only)
- 61.05.Qr Magnetic resonance techniques; Mossbauer spectroscopy (for structure determination only)