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In this work, three different material systems comprising carbon were researched: (i) Organic polymers and small molecules, in conjunction with fullerene molecules for applications in organic photovoltaics (OPV), (ii) single walled semiconducting carbon nanotubes and (iii) silicon carbide (SiC), whose defect color centers are recently in the limelight as candidates for quantum applications. All systems were analyzed using the optically detected magnetic resonance (ODMR) spectroscopy.
In the OPV chapter, first the intrinsic parameters and orientations of high spin excitons were analyzed in the materials P3HT, PTB7 and DIP. Specifically the influence of ordering in these organic systems was adressed. The second part of the OPV chapter is concerned with triplet generation by electron back transfer in the high-efficiency OPV material combination PTB7:PC71BM.
The carbon nanotube chapter first shows the way to the first unambiguous proof of the existence of triplet excitons in semiconducting (6,5) single-walled carbon nanotubes (SWNT) by ODMR spectroscopy. A model for exciton kinetics, and also orientation and intrinsic parameters were propoesed.
The last part of this work is devoted to spin centers in silicon carbide (SiC). After a brief introduction, the spin multiplicity of the V2 and V3 silicon vacancies, and also of a Frenkel pair and an unassigned defect UD in 6H SiC, and of the V2 vacancy and the Frenkel pair in 4H SiC, was shown to be S=3/2. The spin polarized pumping of the 3/2 manifold of the quartet ground state of the silicon vacancies allows stimulated microwave emission. Furthermore, in 6H SiC, the UD and Frenkel pair were shown to have a large dependence of their intrinsic zero field interaction parameters on the temperature, while the vacancies are temperature independent. The application of the UD and Frenkel pair as temperature sensor, and of the vacancies as a vector magnetic field sensor is discussed.
The focus of this work is studying recombination mechanisms occurring in organic solar cells, as well as their impact on one of their most important parameters — the open circuit voltage Voc.
Firstly, the relationship between Voc and the respective charge carrier density n in the active layer under open circuit conditions is analyzed. Therefor, a model after Shockley for the open circuit voltage is used, whose validity is proven with the aid of fits to the measured data. Thereby, it is emphasized that the equation is only valid under special conditions. In the used reference system P3HT:PC61BM the fits are in agreement with the measurement data only in the range of high temperatures (150 - 300 K), where Voc increases linearly with decreasing temperature. At lower temperatures (50 – 150 K), the experiment shows a saturation of Voc. This saturation cannot be explained with the model by the measured falling charge carrier density with decreasing temperatures. In this temperature range Voc is not directly related to the intrinsic properties of the active layer. Voc saturation is due to injection energy barriers at the contacts, which is ascertained by macroscopic simulations. Furthermore, it is observed that Voc in the case of saturation is equivalent to the so-called built-in potential. The difference between the built-in potential and the energy gap corresponds thereby to the sum of the energy barriers at both contacts.
With the knowledge of the Voc(n) dependency for not contact limited solar cells, it is possible to investigate the recombination mechanisms of charge carriers in the active layer. For Langevin recombination the recombination rate is Rn2 (recombination order RO = 2), for Shockley-Read-Hall (SRH) Rn1 (RO=1); in various publications RO higher than two is reported with two main explanations.
1: Trap states for charge carriers exist in the respective separated phases, i.e. electrons in the acceptor phase and holes in the donor phase, which leads to a delayed recombination of the charge carriers at the interface of both phases and finally to an apparent recombination order higher than 2.
2: The enhanced R(n) dependency is attributed to the so called recombination prefactor, which again is dependent from n dependent mobility µ.
It is shown that for the system P3HT:PC61BM at room temperature the µ(n) dependency does nearly completely explain the higher RO but not at lower temperatures which in this case supports the first explanation. In the material system PTB7:PC71BM the increased RO cannot be explained by the µ(n) dependency even at room temperature.
To support the importance of trap states in combination with a phase separation for the explanation of the enhanced RO, additional trap states were incorporated in the solar cells to investigate their influence on the recombination mechanisms. To achieve this, P3HT:PC61BM solar cells were exposed to synthetic air (in the dark and under illumination) or TCNQ was added in small concentrations to the active layer which act as electron traps. For the oxygen degraded solar cell the recombination order is determined by a combination of open Voc-transients and Voc(n) measurements. Thereby, a continuous increase of the recombination order from 2.4 to more than 5 is observed with higher degradation times. By the evaluation of the ideality factor it can be shown that the impact of SRH recombination is increasing with higher trap concentration in relation to Langevin recombination. A similar picture is revealed for solar cells with TCNQ as extrinsic trap states.
Finally, a phenomenon called s-shaped IV-curves is investigated, which can sometimes occur for solar cells under illumination. As course of this a reduced surface recombination velocity can be found. Experimentally, the solar cells were fabricated using a special plasma treatment of the ITO contact. The measured IV-curves of such solar cells are reproduced by macroscopic simulations, where the surface recombination velocity is reduced. Hereby, it has to be distinguished between the surface recombination of majority and minority charge carriers at the respective contacts. The theory can be experimentally confirmed by illumination level dependent IV-curves as well as short circuit current density and open circuit voltage transients.