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The present thesis deals with surface treatment, material improvement, and the electronic structure of the diluted magnetic semiconductor (Ga,Mn)As. The two key issues are the preparation of clean surfaces and the observation of potential valence hybridizations in (Ga,Mn)As by means of photoemission spectroscopy. Several cleaning methods are applied individually to (Ga,Mn)As and their e ects are compared in detail by various methods. Based on the results of each method, a sophisticated recipe has been elaborated, which provides clean, stoichiometric, and reconstructed surfaces, even if the sample was exposed to air prior to preparation. Moreover, the recipe works equally well for intentionally oxidized surfaces. The individual advantages of ex-situ wet- chemical etching and in situ ion-milling and tempering can be combined in an unique way. In regard to the post-growth annealing in order to optimize the electronic and magnetic properties of (Ga,Mn)As, the effect of surface segregation of interstitial Mn was quantifed. It turns out that the Mn concentration at the surface increases by a factor 4.3 after annealing at 190 C for 150 h. The removal of the segregated and oxidized species by wet-chemical etching allows a tentative estimate of the content of interstitial Mn. 19-23% of the overall Mn content in as-grown samples resides on interstitial positions. The complementary results of core level photoemission spectroscopy and resonant photoemission spectroscopy give hints to the fact that a sizeable valence hybridization of Mn is present in (Ga,Mn)As. This outlines that the simple Mn 3d5-con guration is too naive to refect the true electronic structure of substitutional Mn in (Ga,Mn)As. Great similarities in the core level spectra are found to MnAs. The bonding is thus dominantly of covalent, not ionic, character. Transport measurements, in particular for very low temperatures (<10 K), are in agreement with previous results. This shows that at low temperature, the conduction is mainly governed by variable-range hopping which is in line with the presence of an impurity band formed by substitutional Mn. In the light of the presented results, it is therefore concluded that a double-exchange interaction is the dominant mechanism leading to ferromagnetic coupling in (Ga,Mn)As. The valence hybridization and the presents of an impurity band, both of which are inherent properties of substitutional Mn, are indications for a double-exchange scenario, being at variance to a RKKY-based explanation. Contributions from a RKKY-like mechanism cannot definitely be excluded, however, they are not dominant.
The present thesis is concerned with molecular beam epitaxy of magnetite (Fe3O4) thin films on semiconducting substrates and the characterization of their structural, chemical, electronic, and magnetic properties. Magnetite films could successfully be grown on ZnO substrates with high structural quality and atomically abrupt interfaces. The films are structurally almost completely relaxed exhibiting nearly the same in-plane and out-of-plane lattice constants as in the bulk material. Films are phase-pure and show only small deviations from the ideal stoichiometry at the surface and in some cases at the interface. Growth proceeds via wetting layer plus island mode and results in a domain structure of the films. Upon coalescence of growing islands twin-boundaries (rotational twinning) and anti-phase boundaries are formed. The overall magnetization is nearly bulk-like, but shows a slower approach to saturation, which can be ascribed to the reduced magnetization at anti-phase boundaries. However, the surface magnetization which was probed by x-ray magnetic circular dichroism was significantly decreased and is ascribed to a magnetically inactive layer at the surface. Such a reduced surface magnetization was also observed for films grown on InAs and GaAs. Magnetite could also be grown with nearly ideal iron-oxygen stoichiometry on InAs substrates. However, interfacial reactions of InAs with oxygen occur and result in arsenic oxides and indium enrichment. The grown films are of polycrystalline nature. For the fabrication of Fe3O4/GaAs films, a postoxidation of epitaxial Fe films on GaAs was applied. Growth proceeds by a transformation of the topmost Fe layers into magnetite. Depending on specific growth conditions, an Fe layer of different thickness remains at the interface. The structural properties are improved in comparison with films on InAs, and the resulting films are well oriented along [001] in growth direction. The magnetic properties are influenced by the presence of the Fe interface layer as well. The saturation magnetization is increased and the approach to saturation is faster than for films on the other substrates. We argue that this is connected to a decreased density of anti-phase boundaries because of the special growth method. Interface phases, viz. arsenic and gallium oxides, are quantified and different growth conditions are compared with respect to the interface composition.