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Exploring the transport properties of the three-dimensional topological insulator material HgTe
(2015)
In the present thesis the transport properties of strained bulk HgTe devices are investigated. Strained HgTe forms a 3D TI and is of special interest for studying topological surface states, since it can be grown by MBE in high crystal quality. The low defect density leads to considerable mobility values, well above the mobilities of other TI materials. However, strained HgTe has a small band gap of ca. 20 meV. With respect to possible applications the question is important, under which conditions the surface transport occurs. To answer this question, the HgTe devices are investigated at dilution refrigerator temperatures (T<100 mK) in high magnetic fields of different orientation. The influence of top and back gate electrodes as well as surface protecting layers is discussed.
On the basis of an analysis of the quantum Hall behaviour it is shown that transport is dominated by the topological surface states in a surprisingly large parameter range. A dependence on the applied top gate voltage is presented for the topological surface states. It enables the first demonstration of an odd integer QHE sequence from the surfaces perpendicular to the magnetic field. Furthermore, the p-type QHE from the surface states is observed for the first time in any 3D TI. This is achieved in samples of high surface quality. It is concluded from the gate response that the screening behaviour in 3D TI devices is non-trivial. The transport data are qualitatively analysed by means of intuitive theoretical models.