Multi-lens array full-field X-ray microscopy
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- X-ray full-field microscopy at laboratory sources for photon energies above 10 keV suffers from either long exposure times or low resolution. The photon flux is mainly limited by the objectives used, having a limited numerical aperture NA. We show that this can be overcome by making use of the cone-beam illumination of laboratory sources by imaging the same field of view (FoV) several times under slightly different angles using an array of X-ray lenses. Using this technique, the exposure time can be reduced drastically without any loss in termsX-ray full-field microscopy at laboratory sources for photon energies above 10 keV suffers from either long exposure times or low resolution. The photon flux is mainly limited by the objectives used, having a limited numerical aperture NA. We show that this can be overcome by making use of the cone-beam illumination of laboratory sources by imaging the same field of view (FoV) several times under slightly different angles using an array of X-ray lenses. Using this technique, the exposure time can be reduced drastically without any loss in terms of resolution. A proof-of-principle is given using an existing laboratory metal-jet source at the 9.25 keV Ga K\(_α\)-line and compared to a ray-tracing simulation of the setup.…
Autor(en): | Alexander Opolka, Dominik Müller, Christian Fella, Andreas Balles, Jürgen Mohr, Arndt Last |
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URN: | urn:nbn:de:bvb:20-opus-244974 |
Dokumentart: | Artikel / Aufsatz in einer Zeitschrift |
Institute der Universität: | Fakultät für Physik und Astronomie / Physikalisches Institut |
Sprache der Veröffentlichung: | Englisch |
Titel des übergeordneten Werkes / der Zeitschrift (Englisch): | Applied Sciences |
ISSN: | 2076-3417 |
Erscheinungsjahr: | 2021 |
Band / Jahrgang: | 11 |
Heft / Ausgabe: | 16 |
Aufsatznummer: | 7234 |
Originalveröffentlichung / Quelle: | Applied Sciences (2021) 11:16, 7234. https://doi.org/10.3390/app11167234 |
DOI: | https://doi.org/10.3390/app11167234 |
Allgemeine fachliche Zuordnung (DDC-Klassifikation): | 5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik |
Freie Schlagwort(e): | CRLs; X-ray microscopy; compound refractive X-ray lenses; full-field microscopy |
Datum der Freischaltung: | 24.05.2023 |
Datum der Erstveröffentlichung: | 05.08.2021 |
Lizenz (Deutsch): | CC BY: Creative-Commons-Lizenz: Namensnennung 4.0 International |