The orientation independence of the CdTe-HgTe valence band offset as determined by x-ray photoelectron spectroscopy
Please always quote using this URN: urn:nbn:de:bvb:20-opus-30784
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Author: | Charles R. Becker, Y. S. Wu, A. Waag, M. M. Kraus, G. Landwehr |
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URN: | urn:nbn:de:bvb:20-opus-30784 |
Document Type: | Journal article |
Faculties: | Fakultät für Physik und Astronomie / Physikalisches Institut |
Language: | English |
Year of Completion: | 1991 |
Source: | In: Semicond. Sci. Technol. (1991) 6, C76-C79. |
Dewey Decimal Classification: | 5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik |
Release Date: | 2009/01/08 |