Investigation of a short period (001) HgTe-Hg\(_{0.6}\)Cd\(_{0.4}\)Te superlattice by transmission electron microscopy
Please always quote using this URN: urn:nbn:de:bvb:20-opus-38029
- No abstract available
Author: | X. F. Zhang, Charles R. Becker, H. Zhang, L. He, G. Landwehr |
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URN: | urn:nbn:de:bvb:20-opus-38029 |
Document Type: | Journal article |
Faculties: | Fakultät für Physik und Astronomie / Physikalisches Institut |
Language: | English |
Year of Completion: | 1994 |
Source: | Semiconductor science and technology (1994) 9, 2217-2223. |
Dewey Decimal Classification: | 5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik |
Release Date: | 2009/09/16 |