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Dephasing rates for weak localization and universal conductance fluctuations in two dimensional Si: P and Ge: P δ-layers

Please always quote using this URN: urn:nbn:de:bvb:20-opus-170934
  • We report quantum transport measurements on two dimensional (2D) Si:P and Ge:P δ-layers and compare the inelastic scattering rates relevant for weak localization (WL) and universal conductance fluctuations (UCF) for devices of various doping densities (0.3–2.5 × 10\(^{18}\)m\(^{−2}\)) at low temperatures (0.3–4.2 K). The phase breaking rate extracted experimentally from measurements of WL correction to conductivity and UCF agree well with each other within the entire temperature range. This establishes that WL and UCF, being the outcome ofWe report quantum transport measurements on two dimensional (2D) Si:P and Ge:P δ-layers and compare the inelastic scattering rates relevant for weak localization (WL) and universal conductance fluctuations (UCF) for devices of various doping densities (0.3–2.5 × 10\(^{18}\)m\(^{−2}\)) at low temperatures (0.3–4.2 K). The phase breaking rate extracted experimentally from measurements of WL correction to conductivity and UCF agree well with each other within the entire temperature range. This establishes that WL and UCF, being the outcome of quantum interference phenomena, are governed by the same dephasing rate.show moreshow less

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Metadaten
Author: Saquib Shamim, S. Mahapatra, G. Scappucci, W. M. Klesse, M. Y. Simmons, Arindam Ghosh
URN:urn:nbn:de:bvb:20-opus-170934
Document Type:Journal article
Faculties:Fakultät für Physik und Astronomie / Physikalisches Institut
Language:English
Parent Title (English):Scientific Reports
Year of Completion:2017
Volume:7
Issue:46670
Source:Scientific Reports 2017, 7:46670. DOI: 10.1038/srep46670
DOI:https://doi.org/10.1038/srep46670
Pubmed Id:https://pubmed.ncbi.nlm.nih.gov/28470166
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Tag:electronic properties and materials; quantum information; two-dimensional materials
Release Date:2019/10/14
Licence (German):License LogoCC BY: Creative-Commons-Lizenz: Namensnennung 4.0 International