The dielectric constant of PbTe at 4.2 K and \(\tilde ν\)=84.15 cm\(^{-1}\), 96.97 cm\(^{-1}\), 103.60 cm\(^{-1}\)

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  • The dielectric constant of a PbTe epitaxial layer has been measured by surface wave spectroscopy using an optically pumped far-infrared laser and the technique of attenuated total reflection.

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Author: M. Tacke, W. Schuberth, Charles R. Becker, L. D. Haas
Document Type:Journal article
Faculties:Fakultät für Physik und Astronomie / Physikalisches Institut
Year of Completion:1982
Source:Appl. Phys. A (1982) 28, 229-233.
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Release Date:2009/09/05