Spectral-interference microscopy for characterization of functional plasmonic elements
Zitieren Sie bitte immer diese URN: urn:nbn:de:bvb:20-opus-85922
- Plasmonic modes supported by noble-metal nanostructures offer strong subwavelength electric-field confinement and promise the realization of nanometer-scale integrated optical circuits with well-defined functionality. In order to measure the spectral and spatial response functions of such plasmonic elements, we combine a confocal microscope setup with spectral interferometry detection. The setup, data acquisition, and data evaluation are discussed in detail by means of exemplary experiments involving propagating plasmons transmitted throughPlasmonic modes supported by noble-metal nanostructures offer strong subwavelength electric-field confinement and promise the realization of nanometer-scale integrated optical circuits with well-defined functionality. In order to measure the spectral and spatial response functions of such plasmonic elements, we combine a confocal microscope setup with spectral interferometry detection. The setup, data acquisition, and data evaluation are discussed in detail by means of exemplary experiments involving propagating plasmons transmitted through silver nanowires. By considering and experimentally calibrating any setup-inherent signal delay with an accuracy of 1 fs, we are able to extract correct timing information of propagating plasmons. The method can be applied, e.g., to determine the dispersion and group velocity of propagating plasmons in nanostructures, and can be extended towards the investigation of nonlinear phenomena.…
Autor(en): | Christian Rewitz, Thomas Keitzl, Philip Tuchscherer, Sebastian Goetz, Peter Geisler, Gary Razinskas, Bert Hecht, Tobias Brixner |
---|---|
URN: | urn:nbn:de:bvb:20-opus-85922 |
Dokumentart: | Artikel / Aufsatz in einer Zeitschrift |
Institute der Universität: | Fakultät für Chemie und Pharmazie / Institut für Physikalische und Theoretische Chemie |
Sprache der Veröffentlichung: | Englisch |
Titel des übergeordneten Werkes / der Zeitschrift (Englisch): | Optics Express |
Erscheinungsjahr: | 2012 |
Originalveröffentlichung / Quelle: | In: Optics Express (2012) 20: 13, 14632-14647, doi:10.1364/OE.20.014632 |
URL der Erstveröffentlichung: | http://www.opticsinfobase.org/oe/fulltext.cfm?uri=oe-20-13-14632&id=238393 |
Allgemeine fachliche Zuordnung (DDC-Klassifikation): | 5 Naturwissenschaften und Mathematik / 54 Chemie / 540 Chemie und zugeordnete Wissenschaften |
Datum der Freischaltung: | 12.05.2014 |
Sammlungen: | Open-Access-Publikationsfonds / Förderzeitraum 2012 |
Lizenz (Deutsch): | Deutsches Urheberrecht |