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Shaping and spatiotemporal characterization of sub-10-fs pulses focused by a high-NA objective
Zitieren Sie bitte immer diese URN: urn:nbn:de:bvb:20-opus-111120
- We describe a setup consisting of a 4 f pulse shaper and a microscope with a high-NA objective lens and discuss the spects most relevant for an undistorted spatiotemporal profile of the focused beam. We demonstrate shaper-assisted pulse compression in focus to a sub-10-fs duration using phase-resolved interferometric spectral modulation (PRISM). We introduce a nanostructure-based method for sub-diffraction spatiotemporal characterization of strongly focused pulses. The distortions caused by optical aberrations and space–time coupling from theWe describe a setup consisting of a 4 f pulse shaper and a microscope with a high-NA objective lens and discuss the spects most relevant for an undistorted spatiotemporal profile of the focused beam. We demonstrate shaper-assisted pulse compression in focus to a sub-10-fs duration using phase-resolved interferometric spectral modulation (PRISM). We introduce a nanostructure-based method for sub-diffraction spatiotemporal characterization of strongly focused pulses. The distortions caused by optical aberrations and space–time coupling from the shaper can be reduced by careful setup design and alignment to about 10 nm in space and 1 fs in time.…
Autor(en): | Tobias Brixner, Monika Pawłowska, Sebastian Goetz, Christian Dreher, Matthias Wurdack, Enno Krauss, Gary Razinskas, Peter Geisler, Bert Hecht |
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URN: | urn:nbn:de:bvb:20-opus-111120 |
Dokumentart: | Artikel / Aufsatz in einer Zeitschrift |
Institute der Universität: | Fakultät für Physik und Astronomie / Physikalisches Institut |
Fakultät für Chemie und Pharmazie / Institut für Physikalische und Theoretische Chemie | |
Sprache der Veröffentlichung: | Englisch |
Erscheinungsjahr: | 2014 |
Originalveröffentlichung / Quelle: | Optics Express 22, 25 (2014), 31496 - 31510, doi 10.1364/OE.22.031496 |
DOI: | https://doi.org/10.1364/OE.22.031496 |
Sonstige beteiligte Institutionen: | Röntgen Center for Complex Material Systems (RCCM), Am Hubland, 97074 W¨urzburg, Germany |
Allgemeine fachliche Zuordnung (DDC-Klassifikation): | 5 Naturwissenschaften und Mathematik / 54 Chemie / 541 Physikalische Chemie |
Freie Schlagwort(e): | Interference microscopy; Pulse shaping; Scanning microscopy; Subwavelength structures; Ultrafast measurements; nanostructures |
Datum der Freischaltung: | 27.03.2015 |
Sammlungen: | Open-Access-Publikationsfonds / Förderzeitraum 2014 |
Lizenz (Deutsch): | Deutsches Urheberrecht |