High-order finite-element analysis of scattering properties of II-VI semiconductor materials
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- The sattering characteristics ot the n-VI semiconductors were analyzed by a method which combines the second-order finite-element method with the rigorous mode matching procedure. The method avolds the difficulty of solving the complex transcendental equation introduced in the multimode network method and calculates all the eigenvalues and eigenfunctions simultaneously which are needed for the mode matching treatment in the longitudinal direction. As a result, the whole solution procedure is significantly simplified. A comparison is givenThe sattering characteristics ot the n-VI semiconductors were analyzed by a method which combines the second-order finite-element method with the rigorous mode matching procedure. The method avolds the difficulty of solving the complex transcendental equation introduced in the multimode network method and calculates all the eigenvalues and eigenfunctions simultaneously which are needed for the mode matching treatment in the longitudinal direction. As a result, the whole solution procedure is significantly simplified. A comparison is given between the experimental data and the calculated results obtained with this analysis and tbe network method. Very good agreement has been achieved, the accuracy and efficiency of the present method are thus verified.…
Autor(en): | Shanjia Xu, Xinqing Sheng, P. Greiner, Charles R. Becker, R. Geick |
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URN: | urn:nbn:de:bvb:20-opus-86283 |
Dokumentart: | Artikel / Aufsatz in einer Zeitschrift |
Institute der Universität: | Fakultät für Physik und Astronomie / Physikalisches Institut |
Sprache der Veröffentlichung: | Englisch |
Erscheinungsjahr: | 1994 |
Originalveröffentlichung / Quelle: | Chinese Journal of Infrared and Millimeter Waves, 1994, 12, 3, 201-209 |
Allgemeine fachliche Zuordnung (DDC-Klassifikation): | 5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik |
Normierte Schlagworte (GND): | Halbleiter |
Freie Schlagwort(e): | II-VI semiconductor; high-order finite element; mode matching method; scattering characteristics |
Datum der Freischaltung: | 12.06.2014 |
Lizenz (Deutsch): | Deutsches Urheberrecht |